Semiconductor topography including integrated circuit gate condu

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257369, 257377, 257385, 257412, 257413, 257758, 438657, H01K 2976

Patent

active

061371459

ABSTRACT:
A semiconductor topography including integrated circuit gate conductors incorporating dual polysilicon layers is provided. The semiconductor topography includes a semiconductor substrate. A first gate conductor is arranged upon a first gate dielectric and above the semiconductor substrate, and a second gate conductor is arranged upon a second gate dielectric and above the semiconductor substrate. The semiconductor substrate may contain a first active region laterally separated from a second active region by a field region. The first gate conductor may be arranged within the first active region, and the second gate conductor may be arranged within the second active region. Each gate conductor preferably includes a second polysilicon layer portion arranged upon a first polysilicon layer portion. The thicknesses of the first gate conductor and the second gate conductor are preferably equal. The first gate conductor may be doped with a first dopant that has a lower diffusion rate through polysilicon than a second dopant with which the second gate conductor is doped. The second polysilicon layer portion of the second gate conductor is substantially free of implanted dopants.

REFERENCES:
patent: 4438556 (1984-03-01), Komatsu et al.
patent: 5021356 (1991-06-01), Henderson et al.
patent: 5158903 (1992-10-01), Hori et al.
patent: 5346836 (1994-09-01), Manning et al.
patent: 5355010 (1994-10-01), Fujii et al.
patent: 5501995 (1996-03-01), Shin et al.
patent: 5521416 (1996-05-01), Matsuoka et al.
patent: 5543646 (1996-08-01), Satoh et al.
patent: 5574294 (1996-11-01), Shepard
patent: 5585659 (1996-12-01), Kobayashi et al.
patent: 5616948 (1997-04-01), Pfiester
patent: 5710454 (1998-01-01), Wu
patent: 5744845 (1998-04-01), Sayama et al.
patent: 5851889 (1998-12-01), Michael et al.
patent: 5877535 (1999-03-01), Matsumoto

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor topography including integrated circuit gate condu does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor topography including integrated circuit gate condu, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor topography including integrated circuit gate condu will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1966492

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.