Automatic semiconductor wafer tester

Details Automatic semiconductor wafer tester Automatic semiconductor wafer tester

1985-04-26

1987-12-01

Holtje, Nelson C.

Measuring, testing, or signalling instruments

Measuring, regulating or indicating instrument, or casing

Electrical property

D10 46

Patent

active

D02929791

REFERENCES:
patent: D173618 (1954-12-01), Hose
patent: D215120 (1969-09-01), Estes
patent: D276315 (1984-11-01), Collister
patent: D282724 (1986-02-01), Collister
patent: D283107 (1986-03-01), Collister
patent: 4348636 (1982-09-01), Doundoulakis
patent: 4520931 (1985-06-01), Evain

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