Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Patent
1980-07-28
1982-06-01
Martin, Jr., Roland E.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
430313, 430506, 1566611, G03C 500
Patent
active
043328814
ABSTRACT:
The problem of reliably adhering resists to underlying surfaces made of, for example, phosphorus-doped silicon dioxide or silicon nitride is a particularly difficult one. In practice, the use of standard adhesion promoters such as HMDS provides only marginal relief. By baking a relatively thin layer of resist on the underlying layer, a tenacious bond between the thin layer and the underlying surface is achieved. Subsequently, a relatively thick layer of resist is applied and patterned in a standard way. An excellent bond between the thick and thin resist layers results. Subsequent processing of the patterned thick layer leaves the two noted bonded interfaces virtually intact.
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Bell Telephone Laboratories Incorporated
Canepa Lucian C.
Martin Jr. Roland E.
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