Method and apparatus for reprogramming a supervoltage circuit

Static information storage and retrieval – Read/write circuit – Testing

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Details

36518909, 365226, G11C 700

Patent

active

059497254

ABSTRACT:
In an integrated circuit including test circuitry for testing integrated circuit function, a programmable supervoltage circuit is described for enabling the test circuitry. The supervoltage circuit includes a reference circuit, a step-down circuit, a sensing circuit, and an output circuit. The reference circuit produces a reference voltage. The step-down circuit receives an input voltage and produces a stepped-down voltage. The sensing circuit is coupled with the reference and step-down circuits, receives the reference and stepped-down voltages, and produces a sense signal as a function of the relative values of the reference and stepped-down voltages. The output circuit is coupled with the sensing circuit, receives the sense signal, and produces a supervoltage output signal to enable the test circuitry. In a first embodiment, a programmable selection circuit is coupled with and selectively shunts one or more circuit elements in the step-down circuit to adjust the value of the stepped-down voltage relative to the input voltage. In a second embodiment, the selection circuit is coupled with and selectively shunts one or more circuit elements in the reference circuit to adjust the value of the reference voltage. In a third embodiment, the step-down circuit receives the input voltage at a selected one of a plurality of input terminals and produces a corresponding stepped-down voltage.

REFERENCES:
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patent: 5463585 (1995-10-01), Sanada
patent: 5550778 (1996-08-01), Takahashi
patent: 5712575 (1998-01-01), Ma et al.
patent: 5721703 (1998-02-01), Habersetzer et al.
patent: 5745499 (1998-04-01), Ong
patent: 5841714 (1998-11-01), Sher et al.

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