X-ray permeable membrane for X-ray lithographic mask

Compositions – Miscellaneous

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264 81, 378 35, 427249, 427255, 427160, 430 5, G21K 500, G03F 900, C23C 1600

Patent

active

052346099

ABSTRACT:
Disclosed is an X-ray-permeable membrane for X-ray lithographic mask for fine patterning in the manufacture of semiconductor devices having good transparency to visible light and exhibiting excellent resistance against high-energy beam irradiation. The membrane has a chemical composition expressed by the formula SiC.sub.x N.sub.y and can be prepared by the thermal CVD method in an atmosphere of a gaseous mixture consisting of gases comprising, as a group, the elements of silicon, carbon and nitrogen such as a ternary combination of silane, propane and ammonia.

REFERENCES:
patent: 4436797 (1984-03-01), Brady et al.
patent: 4735877 (1988-04-01), Kato et al.
patent: 4804600 (1989-02-01), Kato et al.
patent: 4877641 (1989-10-01), Dory
patent: 4877651 (1989-10-01), Dory
patent: 5005075 (1991-04-01), Kobayashi et al.
patent: 5042945 (1991-08-01), Shibata et al.
patent: 5053255 (1991-10-01), Boeglin
patent: 5061514 (1991-10-01), Boeglin
patent: 5134097 (1992-07-01), Nihara et al.

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