Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Patent
1994-10-26
1996-02-27
Fahmy, Wael M.
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
257378, H01L 2976, H01L 2994
Patent
active
054951208
ABSTRACT:
In a semiconductor device having a bipolar transistor including, on a main surface of a semiconductor substrate, the bipolar transistor and an impurity region of a conductivity type which is different from that of a base region of this bipolar transistor, an impurity for forming the base region is implanted into the entire main surface of a semiconductor substrate to form the base region. Accordingly, the manufacturing costs can be reduced without degrading the performance of the device.
REFERENCES:
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patent: 4717686 (1988-01-01), Jacobs et al.
patent: 5059549 (1991-10-01), Furuhata
patent: 5286991 (1994-02-01), Hui et al.
"High Performance 1.0 um N-Well CMOS/Bipolar Technology", H. Momose et al., Symposium on VLSI Technology Sep. 1983.
"A 1.0 um N-Well CMOS/Bipolar Technology for VLSI Cicuits", J. Miyamoto et al., IEDM Digest of Technical Papers, Dec. 1983.
"High Speed BICMOS VLSI Technology With Buried Twin Well Structure", J. Watanabe et al., EIDM 85.
"High-Speed Bipolar Transistor Compatible With High-Speed CMOS FET Technology", H. Iwasaki et al., Toshiba Review 1985.
"0.8 um BI-CMOS Technology With f.sub.T Ion-Implanted Emitter Bipolar Transistor", H. Iwai et al, IEDM 87.
Fahmy Wael M.
Mitsubishi Denki & Kabushiki Kaisha
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