Semiconductor device having a vertical surround gate metal-oxide

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257330, 257347, 257350, 257369, 257401, 257302, 257306, H01L 2976, H01L 2701, H01L 2994, H01L 27108

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active

059947357

ABSTRACT:
A field effect transistor occupying a small area and a semiconductor device using the same can be obtained. A gate electrode is provided on a substrate on which a source region is provided with a first interlayer insulating film interposed therebetween. The gate electrode is covered with a second interlayer insulating film. A contact hole for exposing a part of the surface of the source region is provided so as to penetrate through the first interlayer insulating film, the gate electrode, and the second interlayer insulating film. A sidewall surface of the contact hole is covered with a gate insulating film. A first semiconductor layer of a first conductivity type is provided on the surface of the source region in contact therewith up to the lower surface of the gate electrode. A channel semiconductor layer is provided on the surface of the first semiconductor layer up to the upper surface of the gate electrode. A second semiconductor layer of a first conductivity type serving as a drain region is provided on the channel semiconductor layer.

REFERENCES:
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patent: 4920397 (1990-04-01), Ishijima
patent: 5016070 (1991-05-01), Sundaresan
patent: 5214296 (1993-05-01), Nakata et al.
patent: 5276343 (1994-01-01), Kumagai et al.
patent: 5308778 (1994-05-01), Fitch et al.
patent: 5336917 (1994-08-01), Kohyama
patent: 5414289 (1995-05-01), Fitch et al.
Impact of Surrounding Gate Transistor (SGT) For Ultra-High-Density LSI's, Hiroshi Takato et al., IEEE Transactions on Electron Devices, vol. 38, No. 3, Mar. 1991, pp. 573-578.
Silicon-On-Insulator "Gate-All-Around Device", J.P. Colinge et al., IEEE, 1990, pp. 25.4.1-25.4.4.

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