Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1994-08-29
1995-04-25
Mintel, William
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
257 50, 257530, 257665, H01L 2704
Patent
active
054101638
ABSTRACT:
A monitor circuit provided in a chip in which a semiconductor integrated circuit is formed. Connection mechanisms and disconnection mechanisms are connected in series in wirings connected to the monitor circuit. Before using the semiconductor integrated circuit, in the state that the connection mechanisms are opened, the monitor circuit is tested without conducting the monitor circuit to the semiconductor integrated circuit. In the case of using the semiconductor integrated circuit, the connection mechanisms are written to close them, so that the monitor circuit is connected to the semiconductor circuit main body and is thus driven. Further, after using the semiconductor integrated circuit, the monitor circuit is separated from the semiconductor integrated circuit by writing the disconnection mechanisms, to be investigated for the characteristic.
REFERENCES:
patent: 4800418 (1989-01-01), Natsui
patent: 4961053 (1990-10-01), Krug
patent: 5025298 (1991-06-01), Fay et al.
patent: 5105235 (1992-04-01), Tomita
patent: 5200919 (1993-04-01), Kaya
Fujitsu Limited
Mintel William
Williams Alexander Oscar
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