Methods of forming ferroelectric thin films

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering

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2041922, 427 38, 2504921, C23C 1434

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050430491

ABSTRACT:
A ferroelectric film is deposited that has desired stoichiometric composition by employing one of two methods: One method comprises depositing a ferroelectric film, e.g., PbTiO.sub.3, followed by ion implanting the deposited ferroelectric film with one of the constitutents or elements comprising the film, such as, Pb, Ti or O.sub.2. The other method comprises depositing the film by sputtering employing a sputtering gas medium or atmosphere that includes either O.sub.3 or a gaseous form of Pb, such as Pb(C.sub.2 H.sub.5).sub.4, PbCl.sub.4, and Pb.sub.2 O(OH).sub.2, followed by annealing.

REFERENCES:
patent: 3646527 (1972-02-01), Wada et al.
patent: 3666665 (1972-05-01), Chapman et al.
patent: 3681226 (1972-08-01), Vazel
patent: 3832700 (1974-08-01), Wu et al.
patent: 4149302 (1979-04-01), Cook
patent: 4437139 (1984-03-01), Howard
patent: 4713157 (1987-12-01), McMillan et al.
R. N. Castellano et al., "Ion-Beam Deposition of Thin Films of Ferroelectric Lead Zirconate Titanate (PZT)", Journal of Applied Physics, vol. 50 (6), pp. 4406-4411, Jun., 1979.
R. N. Castellano et al., "Ion-Beam Deposition of Ferroelectric Thin Films Sputtered From Multicomponent Targets", Journal of Vacuum Science Technology, vol. 17 (2), pp. 629-633, Mar./Apr., 1980.

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