Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

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Details

257379, 257922, 36518509, H01L 2358

Patent

active

059862840

ABSTRACT:
A semiconductor device includes a semiconductor chip, a protective wiring layer, and an abnormality detector. At least one of integrated circuits is formed on the semiconductor chip. The protective wiring layer is formed to be spread on the integrated circuit at a very small interval, and made of a conductive light-shielding material. The protective wiring layer is applied with a power supply voltage upon operating the integrated circuit. The abnormality detector monitors the voltage applied to the protective wiring layer and outputs an abnormality detection signal when the monitored voltage is an abnormal voltage.

REFERENCES:
patent: 5663574 (1997-09-01), Hierold et al.
patent: 5864501 (1999-01-01), Lee
patent: 5889410 (1999-03-01), El-Kareh et al.

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