Plasma etching process

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

Patent

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Details

Other Related Categories

156646, 156662, 204192E, 252 791, H01L 21306

Type

Patent

Status

active

Patent number

042552303

Description

ABSTRACT:
In an improved process for the etching of polysilicon substrates, a polysilicon substrate is exposed to plasmas of carbon tetrachloride, chlorinated gas, fluorinated gas or a gas capable of generating both chlorinated and fluorinated plasma species. The combination of a chlorinated and fluorinated etching species substantially reduces undercutting of polysilicon substrates. Improved uniformity of polysilicon etching is also achieved.

REFERENCES:
patent: 4069096 (1978-01-01), Reinberg et al.
patent: 4094722 (1978-06-01), Yamamoto et al.
patent: 4174251 (1979-11-01), Paschke

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