On-chip mobile ion contamination test circuit

Details On-chip mobile ion contamination test circuit On-chip mobile ion contamination test circuit

1997-03-10

1998-08-04

Zarabian, A.

Static information storage and retrieval

Read/write circuit

Testing

324765, G11C 2900

Patent

active

057904634

ABSTRACT:
A circuit for testing for mobile ion contamination of a semiconductor chip has an enabling circuit, a voltage pump, and a regulating circuit. In a normal operating mode, the voltage pump is enabled whenever the substrate voltage drops below a normal operating voltage. In a test-mode, the voltage pump is continuously enabled to continually drive the substrate toward the normal operating voltage. However, the voltage regulating circuit is enabled to shunt current from the substrate to ground whenever the voltage pump drives the substrate beyond a test voltage that is intermediate the normal operating voltage and ground. The regulating circuit thus holds the substrate at the test voltage.

REFERENCES:
patent: 5079744 (1992-01-01), Tobita et al.
patent: 5119337 (1992-06-01), Shimizu et al.
patent: 5212442 (1993-05-01), O'Toole et al.
patent: 5276646 (1994-01-01), Kim et al.

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