Scanning probe microscope

Radiant energy – Inspection of solids or liquids by charged particles

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H01J 3728

Patent

active

056799527

ABSTRACT:
A plurality of scanning tunnelling microscopes and operating them at a time, a control circuit, a memory circuit and an arithmetic circuit are integrated on the same chip and movement of a movable electrode is controlled by the arithmetic circuit and control circuit on the basis of information stored in the memory circuit. An actuator utilizing electrostatic force is formed and the scanning tunnelling microscope is operated by the actuator. A plurality of movable electrodes are provided with scanning probes, respectively, and the positions of the plurality of movable electrodes relative to objects are controlled at a time.

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