Zero-crossing direction and time interval jitter measurement...

Details Zero-crossing direction and time interval jitter measurement... Zero-crossing direction and time interval jitter measurement...

2005-03-08

2005-03-08

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S106000

Reexamination Certificate

active

06865496

ABSTRACT:
A sampling apparatus for use in high data rate jitter measurement systems based on offset sampling uses a trigger circuit, along with a time-based variable delay, to align a sampling strobe to drive two samplers. An input data signal is split and fed via separate signal paths into the two samplers. One of the samplers is delayed in sampling the input signal or the input is delayed to one of the samplers, such that the two samples of the input signal are offset in time. The jitter present in the SUT can be calculated using the two samples. In addition, when using two strobe circuits, the jitter inherently present in the strobe circuits can be compensated for by offset sampling a reference clock with each main strobe to determine the phase and cycle number of the reference clock at each strobe time.

REFERENCES:
patent: 4362394 (1982-12-01), Menlove
patent: 4876655 (1989-10-01), Carlton et al.
patent: 4908784 (1990-03-01), Box et al.
patent: 5162723 (1992-11-01), Marzalek et al.
patent: 5631553 (1997-05-01), Bose et al.
patent: 6185509 (2001-02-01), Wilstrup et al.
patent: 6242899 (2001-06-01), Miller
patent: 6522983 (2003-02-01), Dobos et al.
patent: 6640193 (2003-10-01), Kuyel
patent: 20020196055 (2002-12-01), Jungerman
patent: WO 9939216 (1999-08-01), None
C.W. Rella, G.M.H. Knippels, D.V. Palanker, and H.A. Schwettman;Pulse Shape Measurements Using Differential Optical Gating of a Picosecond Free Electron Laser Source With an Unsynchronized Femtosecond Ti:sapphire Gate; Optics Communications 157 (1998); pp. 335-342.

Affiliated with

Also associated with

Rating

Zero-crossing direction and time interval jitter measurement... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Zero-crossing direction and time interval jitter measurement..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Zero-crossing direction and time interval jitter measurement... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3453774