Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-12-12
2006-12-12
Williams, Alexander Oscar (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE23153, C257SE23167, C257SE27024, C257SE21022, C257S471000, C257S759000, C257S773000, C257S383000, C257S435000, C257S774000, C257S775000, C257S755000, C257S528000, C257S532000, C257S734000, C257S786000, C257S784000, C257SE23020, C257SE23144
Reexamination Certificate
active
07148535
ABSTRACT:
The present invention is an apparatus and system for reducing bondpad capacitance of an integrated circuit. Circuitry of the present invention may produce a negative capacitance approximately equal in magnitude to the capacitance associated with the bondpad and thereby effectively eliminate the bondpad capacitance. Values of the components of the circuitry may be selectively and independently chosen to synthesize a variable range of negative capacitance and thus produce a negative capacitance approximately equal in magnitude to a unique capacitance associated with the bondpad of a variety of integrated circuits.
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patent: 2005/0230783 (2005-10-01), Lin
LSI Logic Corporation
Suiter-Swantz PC LLO
Williams Alexander Oscar
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