Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-07-08
2008-07-08
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07398485
ABSTRACT:
Embodiments herein provide a method and computer program product for optimizing router settings to increase IC yield. A method begins by reviewing yield data in an IC manufacturing line to identify structure-specific mechanisms that impact IC yield. Next, the method establishes a structural identifier for each structure-specific mechanism, wherein the structural identifiers include wire codes, tags, and/or unique identifiers. Different structural identifiers are established for wires having different widths. Furthermore, the method establishes a weighting factor for each structure-specific mechanism, wherein higher weighting factors are established for structure-specific mechanisms comprising thick wires proximate to multiple thick wires. The method establishes the structural identifiers and the weighting factors for incidence of spacing between single wide lines, double wide lines, and triple wide lines and for incidence of wires above large metal lands. Subsequently, the router settings are modified based on the structural identifiers and the weighting factors to minimize systematic defects.
REFERENCES:
patent: 6927489 (2005-08-01), Yaguchi et al.
patent: 2001/0039644 (2001-11-01), Le Coz
patent: 2004/0163062 (2004-08-01), Chevallier et al.
patent: 2005/0060676 (2005-03-01), Matsumura et al.
patent: 2006/0101355 (2006-05-01), Ciplickas et al.
Bickford Jeanne P.
Buehler Markus T.
Hibbeler Jason D.
Koehl Juergen
Maynard Daniel N.
Chiang Jack
Gibb & Rahman, LLC
International Business Machines - Corporation
Kotulak, Esq. Richard M.
Memula Suresh
LandOfFree
Yield optimization in router for systematic defects does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Yield optimization in router for systematic defects, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Yield optimization in router for systematic defects will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2796700