X-ray spectrometer

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type

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Details

250272, 250399, G01M 2300

Patent

active

042800498

ABSTRACT:
An X-ray spectrometer which is arranged inside an evacuatable housing and which comprises a wavelength dependent X-ray detection system and, for irradiating the specimen to be examined, an electron source with an electron deflection system for generating an electron beam and an X-ray source for generating an X-ray beam. The X-ray source consists of an anticathode on which the electron beam can be directed by the electron deflection system in order to generate the X-ray beam.

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