X-ray moire microscope

Details X-ray moire microscope X-ray moire microscope

1996-04-26

1999-01-26

Wong, Don

X-ray or gamma ray systems or devices

Specific application

Telescope or microscope

378 73, G21K 700

Patent

active

058645993

ABSTRACT:
An X-ray microscope having an incident X-ray beam (10) from an X-ray source, a first crystal element (14) extending at an angle (.beta.) across the path of the incident X-ray beam (10), a second crystal element (16) extending parallel to the first crystal element (14) and in spaced relationship (22) thereto, a sample (20) in spaced relationship to the second crystal element (16) and downstream thereof relative to the incident X-ray beam, the first and second crystal elements being movable relative to each other and to the incident X-ray beam so that the orientation of atoms in the second crystal element do not match the orientation of atoms in the first crystal element to thereby produce a forward incident X-ray beam (26) in the direction of the original beam (10) and a diffracted X-ray beam (28) at an angle relative to the incident X-ray beam, the forward and diffracted beams being directed onto the sample (20), a forward beam detector (12) for receiving the forward X-ray beam and a diffracted X-ray detector (38) for receiving the diffracted X-ray beam. Aperture elements (32, 36) are provided in front of the detectors (12, 38) for controlling the forward and diffracted beams incident on the detectors.

REFERENCES:
patent: 5259013 (1993-11-01), Kuriyama et al.
"Physik Instrumente" (PI), Catalog 109-12/90-15, section 7, Waldbraun, Germany, pp. 5.6, 5.7 and 8.6.
"X-Ray Microscopes", Malcolm R. Howells, Janos Kirz and David Sayre, Scientific American, Feb. 19, 1991, vol. 264,, p. 8-94.
"Main Crystallographic Situations for the Formation of X-Ray Moire Patterns", P.A. Bezirganyan, S.E. Bezirganyan & A. O. Aboyan Phys. Stat. Sol. (a) 126, 41 (1991).
Use of the Ewald sphere in aligning crystal pairs to produce X-ray moire fringes, J. Bradler & A.R. Lang, Acta Cryst. 1968 A 24, 246.
"X-Ray Microscopy by Successive Fourier Transformation", J.T. Winthrop & C.R. Worthington, Univ. of Michigan, Dept. of Physics, Feb. 15, 1965.
"X-Ray Microprobe-Microscopy", C.J. Sparks & C.E. Ice, AIP Conf. Proc. 215.
"X-Ray Imaging with Coded Masks", Gerald K. Skinner, Scientific American, Aug. 1988, pp. 84-89.
"Multiplexing Methods in Spectroscopy", Neil J. Sloane, Mathematics Magazine, vol. 52, No. 2, Mar. 1979.
"Lensless Fourier-Transform Method for Optical Holography", George W. Stroke, Applied Physics Letters, vol. 6, No. 10, May 15, 1965.
"Soft X-Ray microscope Using Fourier Transform Holography", I. McNulty, J. Kirz and C. Jacobsen, E. anderson, & M.R. Howells, and H. Rarback, Nuclear Instruments and Methods in Physics Research A291 (1990), pp. 74-79.

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