X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Reexamination Certificate
2008-07-29
2008-07-29
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Telescope or microscope
Reexamination Certificate
active
11533863
ABSTRACT:
An x-ray microscope uses a microfocus x-ray source with a focus spot of less than 10 micrometers and a Wolter condenser having a magnification of about four or more for concentrating x-rays from the source onto a sample. A detector is provided for detecting the x-rays after interaction with the sample, and an x-ray objective is used to form an image of the sample on the detector. The use of the Wolter optic addresses a problem with microfocus sources that arise when the size of the focal spot that must then be imaged onto the sample with the condenser is smaller than the field of view.
REFERENCES:
patent: 2759106 (1956-08-01), Wolter
patent: 5216699 (1993-06-01), Iketaki
patent: 5351279 (1994-09-01), She et al.
patent: 5434910 (1995-07-01), Johnson et al.
patent: 5497008 (1996-03-01), Kumakhov
patent: 5590168 (1996-12-01), Iketaki
patent: 5744813 (1998-04-01), Kumakhov
patent: 6278764 (2001-08-01), Barbee et al.
patent: 6330301 (2001-12-01), Jiang
patent: 6389101 (2002-05-01), Levine et al.
patent: 6560312 (2003-05-01), Cash
patent: 6859516 (2005-02-01), Schneider et al.
patent: 6996207 (2006-02-01), Kumakhov
patent: 7057187 (2006-06-01), Yun et al.
patent: 7365918 (2008-04-01), Yun et al.
patent: 2004/0125442 (2004-07-01), Yun et al.
Larabell, Carolyn A., et al., “X-ray Tomography Generates 3-D Reconstructions of the Yeast,Saccharomyces cerevisiae, at 60-nm Resolution,” Molecular Biology of the Cell, vol. 15, pp. 957-962, Mar. 2004.
Svergun, Dmitri I., et al., “Small-angle scattering studies of biological macromolecules in solution,” Reports on Progress in Physics, vol. 66 pp. 1735-1782, 2003.
Schneider, G., et al., “Computed Tomography of Cryogenic Cells,” Surface Review and Letters, vol. 9, No. 1, pp. 177-183, 2002.
Duewer Frederick W.
Feser Michael
Wang Yuxin
Yun Wenbing
Artman Thomas R
Glick Edward J.
Houston Eliseeva LLP
Xradia, Inc.
LandOfFree
X-ray microscope with microfocus source and Wolter condenser does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-ray microscope with microfocus source and Wolter condenser, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray microscope with microfocus source and Wolter condenser will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3937020