X-ray microscope

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope

Reexamination Certificate

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C378S084000

Reexamination Certificate

active

06996207

ABSTRACT:
X-ray microscope comprise extended X-ray source, as well as means for placement of test object3and recording means, and located between them X-ray capillary lens. Channels of the latter are diverging towards recording means. Means for placement of the test object is located between extended X-ray source and lesser end side of the X-ray capillary lens. The device is characterized in that the walls of the channels (14, 16) for radiation transmission have a coating or are made of material absorbing or scattering X-ray radiation, and have lateral surface shape of truncated cone or pyramid, or that of cylinder or prism. With specified choice of the material, phenomenon of total external reflection is excluded, while rectilinearity of longitudinal axes of the channels ensures their functioning as collimators. Therefore, channels capture radiation only from the fragments of the test object3situated exactly opposite their entrances. As compared with known device, possibility is excluded of radiation capture entering channel18at angles from zero to critical angle θcof total external reflection. Due to this, resolution is fully determined by technological possibilities of decreasing dimension of the channel entrance. The ability of using extended X-ray source allows to reduce substantially time of exposure with simultaneous decrease in the X-ray tube power.

REFERENCES:
patent: 5045696 (1991-09-01), Hirose
patent: 5497008 (1996-03-01), Kumakhov
patent: 6271534 (2001-08-01), Kumakhov
patent: WO 96/01991 (1996-01-01), None
patent: WO 00/73772 (2000-12-01), None
Encyclopedia “Electronica,” Moscow, “Sovetskaya Entsiklopediya” publishing house, 1991, p. 478.
Physical Encyclopedia, Moscow, “Sovetskaya Entsiklopediya” publishing house, 1984, p. 639.

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