X-ray microscope

Details X-ray microscope X-ray microscope

1991-08-29

1993-06-22

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Telescope or microscope

378 84, G21K 700

Patent

active

052221130

ABSTRACT:
The invention is directed to an X-ray microscope having a pulsed X-ray radiation source which supplies an intensive line radiation such as a plasma focus source. The microscope includes a reflecting condenser which focusses the radiation of the radiation source on the specimen to be investigated and an X-ray optic configured as a zone plate. With the zone plate, the specimen is imaged on an X-ray detector with a high resolution. The above combination of elements makes it possible to free an adequately high amount of X-ray energy at the location of the specimen while providing a high resolution free of image errors so that the required short exposure times are provided for the investigation of living cells.

REFERENCES:
patent: 4596030 (1986-06-01), Herziger et al.
patent: 4870674 (1989-09-01), Schmahl et al.
patent: 4912737 (1990-03-01), Ohsuka et al.
patent: 5132994 (1992-07-01), Kato
"The Gottingen X-Ray Microscope and X-Ray Microscopy Experiments at the BESSY Storage Ring", by D. Rudolph, B. Nieman, G. Schmahl and O. Christ, pp. 192 to 202 from X-Ray Microscopy, vol. 43, (1984), published by Springer.

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