X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent
1987-12-09
1989-09-26
Howell, Janice A.
X-ray or gamma ray systems or devices
Specific application
Telescope or microscope
378 84, G21K 700
Patent
active
048706744
ABSTRACT:
An x-ray microscope in which the object is illuminated coherently or partially coherently via a condenser with quasi-monochromatic x-radiation and is imaged enlarged in the image plane by a high resolution x-ray objective. To obtain the highest possible image contrast, there is arranged in the Fourier plane of the x-ray objective an element which imparts a phase shift to a preselected order of diffraction of the radiation. The element extends over the surface region in the Fourier plane which is acted on here by the diffracted radiation to be influenced. The utilization of the phase shift of a preselected order of diffraction of the radiation as compared with the uninfluenced radiation makes it possible to carry out examinations, in particular of biological structures, with a low dose of radiation and nevertheless to produce a high image contrast. Moreover, it is possible to shift the wavelength region of the x-ray radiation to be used toward shorter wavelengths at which, as a result of the lesser absorption, x-ray microscopy was not meaningfully possible heretofore.
REFERENCES:
patent: 4105289 (1978-08-01), Hershel
"Soft X-ray Microscopy at the Hefei Synchrotron Radiation Laboratory", by X. Xie, S. Kang, C. Jia, and T. Jin; Nuclear Instruments and Methods in Physics Research, A 246 (1986), 698-701, North-Holland, Amsterdam, Netherlands.
"Phase Zone Plates for X Ray and the Extreme UV", by Janos Kirz; Journal of the Optical Society of America, vol. 64, No. 3, Mar. 1974.
Rudolph Dietbert
Schmahl Gunter
Carl-Zeiss-Stiftung
Howell Janice A.
Porta David P.
LandOfFree
X-ray microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-ray microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray microscope will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-193235