X-ray or gamma ray systems or devices – Specific application – Lithography
Patent
1996-09-06
1998-08-11
Wong, Don
X-ray or gamma ray systems or devices
Specific application
Lithography
378208, H05K 100
Patent
active
057938369
ABSTRACT:
An X-ray mask pellicle is capable of protecting the X-ray mask from contaminants and the wafer from contact with the X-ray absorber material of the mask. The X-ray mask pellicle is sufficiently thin to allow X-ray exposure at the required mask to wafer gaps yet is sufficiently durable, replaceable, tough and X-ray resistant to be used in X-ray lithography. A thin (organic or inorganic) X-ray mask pellicle to be placed covering the X-ray mask pattern area is fabricated as a thin film and attached to a support ring. A selected area of the pellicle film, tailored to cover the absorber pattern in the X-ray mask, is etched to decrease its thickness to below 2 .mu.m. If the thin film of the pellicle is not itself conductive, a thin conductive film may be coated on both sides. In an alternative embodiment, the separation between the pellicle and the X-ray mask can be achieved by forming the mask with a stepped profile.
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Acosta Raul E.
Angelopoulos Marie
Doany Fuad E.
Kimmel Kurt R.
Maldonado Juan R.
International Business Machines - Corporation
Lockheed Martin Corporation
Schnurmann H. Daniel
Wong Don
Wurm Mark A.
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