X-ray inspection method and apparatus, prepreg inspecting method

Details X-ray inspection method and apparatus, prepreg inspecting method X-ray inspection method and apparatus, prepreg inspecting method

1996-12-18

1998-05-19

Wong, Don

X-ray or gamma ray systems or devices

Specific application

Absorption

378 51, 378 58, G01N 2304

Patent

active

057546215

ABSTRACT:
An X-ray inspection apparatus and method in which an object to be inspected is irradiated with characteristic X-rays containing at least one wavelength which affords a high X-ray absorbance in the object to be inspected. A transmitted X-ray image which has passed through the object to be inspected is detected, and the object to be inspected is inspected on the basis of the transmitted X-ray image. The method and apparatus are utilized to fabricate a multi-layer printed circuit board.

REFERENCES:
patent: 4910757 (1990-03-01), Kiyasu et al.
patent: 5097492 (1992-03-01), Baker et al.
"International Tables for X-ray Crystallography", 1968 pp. 59-65.

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