X-ray imaging apparatus and method with an X-ray interferometer

X-ray or gamma ray systems or devices – Specific application – Holography or interferometry

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07113564

ABSTRACT:
An imaging apparatus and methods for using the same based upon the interposing of a sample in an X-ray interferometer, such as a Bonse-Hart interferometer. An incident X-ray is split, reflected and combined to form first and second interference beams. When a sample is placed in an optical path of one of the beams, the X-ray intensity, phase and transmission direction of the X-ray beam are altered. A change in the amplitude and phase of the interference beams caused by the sample are obtained using a fringe scanning method, and a detector is used to detect the resulting image.

REFERENCES:
patent: 5173928 (1992-12-01), Momose et al.
patent: 4-348262 (1992-12-01), None
patent: 07-209212 (1994-01-01), None
patent: 10-248833 (1998-09-01), None
patent: 2002139459 (2002-05-01), None
patent: 2003-90807 (2003-03-01), None
Bouse, U. et al., “An X-Ray Interferometer”, Applied Physics Letter, vol. 6, No. 8 (Apr. 15, 1965) pp. 155-156.
Becker, P. et al., “The Skew-Symmetric Two-Crystal X-ray Interferometer”, J. of Appl. Crystallography, vol. 7, Part 6 (Dec. 1974), pp. 593-598.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

X-ray imaging apparatus and method with an X-ray interferometer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with X-ray imaging apparatus and method with an X-ray interferometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray imaging apparatus and method with an X-ray interferometer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3596964

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.