X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent
1980-09-17
1982-09-21
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Fluorescence
378 53, G01M 2322
Patent
active
043508898
ABSTRACT:
A new X-ray fluorescence method for testing a sample having two essentially parallel planar faces that provides full matrix effect compensation is disclosed. The intensities of the transmitted and fluorescent beams of photons are measured by X-ray detectors, and the X-ray source and the two detectors are operated so that ##EQU1## where .PHI. is the angle of the primary beam to one face of the sample, .PSI. is the angle of the fluorescent beam to either face of the sample, E.sub.1 is the energy of the photons of the primary beam, and E.sub.2 is the characteristic electron orbital transition energy for the element of interest. From the ratio of the two intensities the mean average concentration of the element is calculated directly without iterative or other complex procedures.
REFERENCES:
patent: 3114832 (1963-12-01), Alvarez
patent: 3375369 (1968-03-01), Goldman
patent: 3660662 (1972-05-01), Puolakka
patent: 3861199 (1975-01-01), Barkhoudarian
patent: 4047029 (1977-09-01), Allport
patent: 4081676 (1978-03-01), Buchnea
patent: 4169228 (1979-09-01), Briska et al.
Buchnea et al., "On-Line Nondestructive Paper Chemistry Analysis by X-Ray Fluorescence," Amer. Nucl. Soc. Trans., vol. 22, pp. 146-148 (1975).
Considine (editor), Van Nostrand's Scientific Encyclopedia, pp. 2353-2356 (5th ed. 1976).
Considine (editor), Process Instruments and Controls Handbook, pp. 6-41 to 6-42, (2nd ed. 1974); three pages on "X-Ray Fluorescence Analytical Methods", (1st ed. 1957).
Frevert et al., "On-line Non-Contacting Determination of Ash Content in Fast-Moving Paper Webs," Industrial Measurement and _Control by Radiation Techniques, pp. 208-214 (1972).
Lucas-Tooth et al., "The Accurate Determination of Major Constituents by X-Ray Fluorescent Analysis in the Presence of Large Interelement Effects," Advances in X-Ray Analysis, vol. 7, pp. 523-541, (1964).
Lucas-Tooth et al., "A Mathematical Method for the Investigation of Inter-Element Effects in X-Ray Fluorescent Analysis," Metallurgia, vol. 64, pp. 149-152 (1961).
McNelles et al., "An On-line Ash Constituent Determination Using X-Ray Fluorescence", (date and place of publication uncertain).
Stern et al., X-rays, pp. 31-35, 202-211, (1970).
Vander, "Method of Measurement of Mean Concentration for an Element Segregated in Layers by X-Ray Analysis," Barrett (editor), Advances In X-Ray Analysis, vol. 21, pp. 143-147, (1978).
"A New Moisture Insensitive Method for Measurement of Paper and Board Coating Weights", Puumalainen Tappi, vol. 63, No. 7, Jul. 1980, pp. 55-57.
Church Craig E.
Gilbert Stephen P.
International Paper Company
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