X-ray or gamma ray systems or devices – Specific application – Lithography
Patent
1998-06-30
2000-06-20
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Lithography
2504922, G21K 500
Patent
active
06078640&
ABSTRACT:
An exposure method and apparatus for lithographically transferring a pattern of a mask onto a substrate to be exposed, wherein a detecting system detects a relative positional relation between the mask and the substrate with respect to at least a predetermined direction, a stage member changes the relative positional relation between the mask and the substrate, on the basis of the detection by the detecting system, a magnification correcting mechanism corrects a transfer magnification of the mask pattern to the substrate, a control system for the stage member corrects one of a drive amount of the stage member and a detection result of the detecting system in accordance with a positional deviation of the mask pattern attributable to the correction operation of the magnification correcting mechanism.
REFERENCES:
patent: 5329126 (1994-07-01), Amemiya et al.
Hasegawa Takayuki
Miyachi Takeshi
Canon Kabushiki Kaisha
Church Craig E.
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