X-ray exposure apparatus

X-ray or gamma ray systems or devices – Specific application – Lithography

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2504922, G21K 500

Patent

active

06078640&

ABSTRACT:
An exposure method and apparatus for lithographically transferring a pattern of a mask onto a substrate to be exposed, wherein a detecting system detects a relative positional relation between the mask and the substrate with respect to at least a predetermined direction, a stage member changes the relative positional relation between the mask and the substrate, on the basis of the detection by the detecting system, a magnification correcting mechanism corrects a transfer magnification of the mask pattern to the substrate, a control system for the stage member corrects one of a drive amount of the stage member and a detection result of the detecting system in accordance with a positional deviation of the mask pattern attributable to the correction operation of the magnification correcting mechanism.

REFERENCES:
patent: 5329126 (1994-07-01), Amemiya et al.

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