X-Ray examination device having a high local resolution

Details X-Ray examination device having a high local resolution X-Ray examination device having a high local resolution

1982-02-02

1984-08-14

Church, Craig E.

X-ray or gamma ray systems or devices

Beam control

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378149, G03B 4116

Patent

active

044661134

ABSTRACT:
In an X-ray examination device which comprises an X-ray source for irradiating a body and a detector device, a displaceable diaphragm device defines an angle of aperture which is substantially smaller, due to the selection of the dimension of the apertures, than the measuring angle defined by the associated radiation detector and the X-ray source. By displacement of the aperture with respect to the object to be measured during the measurement over a distance which covers the measuring angle, a high-resolution shadow image can be formed. The entire object is then contiguously irradiated.

REFERENCES:
patent: 3944833 (1976-03-01), Hounsfield
patent: 4160167 (1979-07-01), Weiss
patent: 4366574 (1982-12-01), Hill

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