4. X-ray or gamma ray systems or devices
  5. Beam control
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Helmut Strecker

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Apparatus for examination by scattered radiation

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Central gas supply system and filter adapter therefor

Gas separation – With nonliquid cleaning means for separating media – Solid agent cleaning member movingly contacts apparatus
Patent

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Method for determining the change in position of an item of...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method for determining the change in position of an item of...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Nuclide generator for preparing radio-nuclides

Radiant energy – Fluent material containment – support or transfer means – With irradiating source or radiating fluent material
Patent

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Profile ID: LFUS-PAI-P-242966

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