X-ray diffraction apparatus

Details X-ray diffraction apparatus X-ray diffraction apparatus

1993-03-15

1996-02-13

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 49, 378 82, 378 90, G01N 2320

Patent

active

054917387

ABSTRACT:
An x-ray diffraction apparatus for use in analyzing the x-ray diffraction pattern of a sample. The apparatus includes a beam source for generating a collimated x-ray beam having one or more discrete x-ray energies, a holder for holding the sample to be analyzed in the path of the beam, and a charge-coupled device having an array of pixels for detecting, in one or more selected photon energy ranges, x-ray diffraction photons produced by irradiating such a sample with said beam. The CCD is coupled to an output unit which receives input information relating to the energies of photons striking each pixel in the CCD, and constructs the diffraction pattern of photons within a selected energy range striking the CCD.

REFERENCES:
patent: 4245158 (1987-01-01), Burstein et al.
patent: 4955974 (1990-09-01), Rhodes et al.
Janesick, J. R., et al., "Present and Future CCDs For UV and X-Ray Scientific Measurements," IEEE Trans. NS-32 1(409):1-8 (1985).
Janesick, J. R., et al., "Charge-coupled device advances for x-ray scientific applications in 1986," Optical Engineer. 26(2):156-166 (1987).
Lumb, D. H., "Calibration and X-Ray Spectroscopy with Silicon CCSs," Nucl. Instr. Meth. Phys. Res. A290:559-564 (1990).
Luppino, G. A., et al., "Imaging and Nondispersive spectroscopy of soft x rays using a laboratory x-ray charge-coupled-device system," Optical Engineer. 26(10):1048-1054 (1987).

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