4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Friedemann Freund

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Method and apparatus for charge distribution analysis

Electricity: measuring and testing – A material property using electrostatic phenomenon
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Method and apparatus for charge distribution analysis

Electricity: measuring and testing – Using ionization effects
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Method of processing high purity low-OH vitreous silica fibers

Glass manufacturing – Processes – Forming product or preform from molten glass
Patent

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X-ray diffraction apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Profile ID: LFUS-PAI-P-432673

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