X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2011-07-12
2011-07-12
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S044000
Reexamination Certificate
active
07978820
ABSTRACT:
An instrument capable of both X-ray diffraction, XRD, and X-ray fluorescence measurements, XRF, arranges an X-ray source10creating an incident X-ray beam directed to a sample on a sample stage. An X-ray detection system is mounted at a fixed angle2θfor high energy energy dispersive XRD For XRF, an X-ray detection system is used.
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Kharchenko Alexander
Meier Roger
van den Hoogenhof Walter
Blakely & Sokoloff, Taylor & Zafman
Kiknadze Irakli
Panalytical B.V.
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