X-ray diffraction and fluorescence

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Reexamination Certificate

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C378S044000

Reexamination Certificate

active

07978820

ABSTRACT:
An instrument capable of both X-ray diffraction, XRD, and X-ray fluorescence measurements, XRF, arranges an X-ray source10creating an incident X-ray beam directed to a sample on a sample stage. An X-ray detection system is mounted at a fixed angle2θfor high energy energy dispersive XRD For XRF, an X-ray detection system is used.

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patent: 6577705 (2003-06-01), Chang et al.
patent: 7796726 (2010-09-01), Gendreau et al.
patent: 7885383 (2011-02-01), He
patent: 2005/0018809 (2005-01-01), Gibson et al.
patent: 2009/0141861 (2009-06-01), Gaved et al.

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