Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Patent
1981-01-08
1983-05-03
Anderson, Bruce C.
Radiant energy
Inspection of solids or liquids by charged particles
Electron probe type
250370, 250396R, 378147, G01N 2300, G01T 122
Patent
active
043821839
ABSTRACT:
An X-ray detector of semiconductor type in which reflected electrons emitted from a sample are diverted to another direction by the action of a magnetic field provided across a passage for X-rays from a sample to an X-ray detecting element of semiconductor type, and an absorbent for absorbing reflected electrons is arranged ahead of the magnetic field in the path of the diverted reflected electrons, so as to prevent the reflected electrons from being incident on the X-ray detecting element, thereby improving the S/N ratio of the detecting element.
REFERENCES:
patent: 3471694 (1969-10-01), Poen
patent: 3614424 (1971-10-01), Openshaw
Anderson Bruce C.
Horiba Ltd.
LandOfFree
X-Ray detector of semiconductor type does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-Ray detector of semiconductor type, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-Ray detector of semiconductor type will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1209831