Write-inhibit circuit, semiconductor integrated circuit...

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Reexamination Certificate

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C365S189011

Reexamination Certificate

active

06594185

ABSTRACT:

BACKGROUND OF THE INVENTION
1. Technical Field
The present invention relates to a write-inhibit circuit for use in a semiconductor integrated circuit including a nonvolatile memory, an ink cartridge
10
including the semiconductor integrated circuit, and an ink-jet recording apparatus in which the ink cartridge is mounted.
2. Background Art
Conventionally, in a case in which a power-supply voltage decreases due to some cause when the desired data is written in a nonvolatile memory built into a semiconductor integrated circuit, miswriting may be performed. To prevent the miswriting, a write-inhibit circuit may be provided in the semiconductor integrated circuit.
FIG. 13
is a block diagram showing an example of a write-inhibit circuit built into a semiconductor integrated circuit. In this figure, a write-inhibit circuit
100
includes a resistor array
101
, an operational amplifier
102
, a bias circuit
103
, a logic gate
104
, and a reference-voltage supply
105
.
The resistor array
101
is formed by a resistor R
1
and a resistor R
2
which are connected in series. One end of the resistor R
1
is connected to a high-potential power supply VDD. One end of the resistor R
2
is connected to a low-potential power supply VSS. By connecting the junction of the resistor R
1
and the resistor R
2
to the gate of a transistor Q
2
, a voltage that is divided corresponding to a resistance ratio between the resistor R
1
and the resistor R
2
is applied to the gate of the transistor Q
2
.
The operational amplifier
102
is formed such that the transistors Q
1
and Q
2
, which are connected in series, are connected in parallel to transistors Q
3
and Q
4
. The gates of the transistors Q
1
and Q
3
are connected in common, and are connected to the junction of the transistor Q
1
and transistor Q
2
. The junction of the transistor Q
3
and the transistor Q
4
is connected as an output end to the gate of a transistor Q
6
at the subsequent stage. A reference voltage Vref is applied from the reference-voltage supply
105
to the gate of the transistor Q
4
.
The bias circuit
103
is provided between a low-potential connection end (the junction of the transistors Q
2
and Q
4
) of the operational amplifier
102
and the low potential power supply VSS, and includes the transistor Q
5
, which is applied a power-supply voltage Vreg having a predetermined potential, and a transistor Q
7
connected in common to the back gate of the transistor Q
5
.
The logic gate
104
is formed by a NOR gate G
11
. The NOR gate G
11
has one input end to which an inverted signal of a writing request signal WR is input. Also, the junction of the transistor Q
6
and the transistor Q
7
is connected to the other input end of the NOR gate G
11
, so that the potential of the junction is input, and an inverted signal of a logical addition of the inputs is output.
In the above-described construction, when the voltage value of the high potential power supply VDD is sufficiently higher than the reference voltage Vref of the reference-voltage supply
105
, the output of the operational amplifier
102
is at “L”, and the transistor Q
6
is in off-state. Then, “L” is applied to the other input end of the NOR gate G
11
, so that the data-writing request signal WR is unchanged and output as a write-control signal WRITE.
In addition, in a case in which the voltage value of the high potential power supply VDD decreases for some reason, the voltage applied to the transistor Q
2
, which is divided by the resistor array
101
, is less than the reference voltage Vref, the output of the operational amplifier
102
is at “H”, so that the transistor Q
6
is in on-state.
At this time, “H” is applied to the other input end of the NOR gate G
11
. Thus, irrespective of whether the data-writing request signal WR is either at “H” or “L”, the write-control signal WRITE is at “L”. In other words, the power-supply voltage decreases, and miswriting can be prevented because writing by the data-writing request signal WR cannot be performed.
The write-inhibit circuit
100
has a relatively high detection precision since it uses the operational amplifier
102
. However, the write-inhibit circuit
100
has the following defects. Specifically, the write-inhibit circuit
100
must include, other than the operational amplifier
102
, the resistor array
101
, the bias circuit
103
, the logic gate
104
, and the reference-voltage supply
105
. Among these, in particular, the resistor array
101
, the logic gate
104
, and the reference-voltage supply
105
are large in circuit size. Accordingly, provision of these in the semiconductor integrated circuit causes a drawback in that the chip area increases.
In addition, in order that the write-inhibit circuit
100
may operate, it is required that, by using the bias circuit
103
, a current always flow in the operational amplifier
102
. This causes a defect in that the operating current increases increasing the power consumption and generated heat increases.
The present invention is made to solve the above defects in the related art, and an object thereof is to reduce a chip area and to provide a write-inhibit circuit in which power consumption is reduced, a semiconductor integrated circuit using the same, an ink cartridge including the semiconductor integrated circuit, and an ink-jet recording apparatus.
Disclosure of Invention
A write-inhibit circuit of the present invention is a write-inhibit circuit using a data-writing request signal as an input and using an output write-control signal to inhibit data writing. The write-inhibit circuit includes a current mirror circuit in which a first transistor array that is formed by connecting in series a plurality of transistors including a depletion transistor, used as a reference-current supply between a high potential power supply and a low potential power supply, is connected in parallel to a second transistor array that is formed by connecting a plurality of transistors between the high potential power supply and the low potential power supply, wherein the write-inhibit circuit leads an output in accordance with the result of comparison between a reference current from the reference-current supply and a current in accordance with the input signal, and when the voltage of the high potential power supply decreases, the write-inhibit circuit leads an output in accordance with the reference current from the reference-current supply.
The second transistor array is formed by connecting in series a first transistor which is connected to the high potential power supply and which is switched on in accordance with the data-writing request signal, a second transistor which allows a current equal to that flowing via the first transistor to flow in the first transistor array, and a third transistor which is switched on together with the first transistor and which forms a current path to the low potential power supply; the first transistor array is formed by connecting in series a fourth transistor which is connected to the high potential power supply and which is switched on in accordance with the data-writing request signal, a fifth transistor having a gate electrode connected in common to the gate terminal of the second transistor, and a sixth transistor as the depletion transistor; and the write-control signal is output from the junction of the fifth transistor and the sixth transistor.
A semiconductor integrated circuit of the present invention includes: the above write-inhibit circuit; a memory cell for storing data at a designated address; and an address generating circuit for sequentially generating addresses for designation in the memory cell. The writing of the data in the memory cell is inhibited based on a write-control signal output from the write-inhibit circuit.
The semiconductor integrated circuit further includes a control means for performing control so as to perform transfer to a low power consumption mode having power consumption less than a normal operating mode for performing a normal operation. The semiconductor integrated circuit may be provi

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