Wrap-back test system and method

Details Wrap-back test system and method Wrap-back test system and method

1996-01-17

1999-09-21

Tse, Young T.

Pulse or digital communications

Transceivers

Loopback mode

375358, 370249, 370366, H04B 144

Patent

active

059563702

ABSTRACT:
A wrap back test system and method for providing local fault detection within a section of an integrated I/O interface core device on an integrated circuit is disclosed. The system and method of this invention is suitable for use in any I/O interface having both a transmitter and a receiver section. The wrap back of input test data, prior to reformatting for transmission, to the receiver's data alignment stage permits fault detection within the core of an integrated I/O interface. By illustration, in a serializer/deserializer I/O, the wrap back of alignment pattern encoded parallel data, prior to serialization, to the receiver's data alignment stage permits identifying faults in just this portion of the I/O transceiver. The wrap back test system and method of this invention permits fault isolation of within the boundaries of the I/O core and independent of external logic or testers.

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