Geometrical instruments – Gauge – Coordinate movable probe or machine
Reexamination Certificate
2006-11-07
2006-11-07
Fulton, Christopher W. (Department: 2859)
Geometrical instruments
Gauge
Coordinate movable probe or machine
C033S558000, C702S095000
Reexamination Certificate
active
07131207
ABSTRACT:
A method of inspecting an artefact using a non contact measurement mounted on a coordinate measuring apparatus. An artefact is measured first with a contact probe (28) and then with a non contact probe (32). An error map or function is generated (34) which corresponds to the difference between the measurements taken with the contact and non-contact probes. This error map or function may be used to calibrate the probe. Alternatively subsequent artefact may be measured with the non contact probe (36) and the error map or function used to correct the measurements (38).
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Fulton Christopher W.
Oliff & Berridg,e PLC
Renishaw PLC
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