Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2006-06-13
2006-06-13
Nguyen, Tuan T. (Department: 2824)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S189090, C365S230020
Reexamination Certificate
active
07061794
ABSTRACT:
A source-biasing mechanism for leakage reduction in SRAM. In standby mode, wordlines are deselected and a source-biasing potential is provided to SRAM cells. In read mode, a selected wordline deactivates the source-biasing potential provided to the selected row of SRAM cells, whereas the remaining SRAM cells on the selected bitline column continue to be source-biased.
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Kenichi Osada et al.; “16.7fA/cell Tunnel-Leakage-Suppressed 16MB SRAM for Handling Cosmic-Ray-Induced Multi-Errors”; 2003 IEEE International Solid-State Circuits Conference; pp. 302-303.
Sabharwal Deepak
Shubat Alexander
Danamraj & Youst. P.C.
Nguyen Dang
Nguyen Tuan T.
Virage Logic Corp.
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