Word line transistor strength control for read and write in...

Static information storage and retrieval – Systems using particular element – Magnetoresistive

Reexamination Certificate

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C365S173000, C365S209000

Reexamination Certificate

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07742329

ABSTRACT:
Systems, circuits and methods for controlling word line voltage at a word line transistor in Spin Transfer Torque Magnetoresistive Random Access Memory (STT-MRAM) are disclosed. A first voltage can be supplied to the word line transistor for write operations. A second voltage, which is less than the first voltage, can be supplied to the word line transistor during read operations.

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