Word-line deficiency detection method for semiconductor...

Details Word-line deficiency detection method for semiconductor... Word-line deficiency detection method for semiconductor...

2005-01-04

2005-01-04

Nguyen, Van Thu (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S210130, C365S214000

Reexamination Certificate

active

06839293

ABSTRACT:
A semiconductor memory device having a burn-in test capability. The semiconductor memory device includes a detection circuit, which is connected to the plurality of word lines. The detection circuit detects whether a stress voltage for a burn-in test has been applied to all of the word lines along their entire lengths in the burn-in test.

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