Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-07-07
2008-03-18
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07346875
ABSTRACT:
An electrical wiring structure and method of designing thereof. The method identifies at least one wire pair having a first wire and a second wire. The second wire is already tri-stated or can be tri-stated. The wire pair may have a same-direction switching probability per clock cycle that is no less than a predetermined or user-selected minimum same-direction switching probability. Alternatively, the wire pair may have an opposite-direction switching probability per clock cycle that is no less than a predetermined or user-selected minimum opposite-direction switching probability. The first wire and the second wire satisfy at least one mathematical relationship involving: a spacing between the first wire and the second wire; and a common run length of the first wire and the second wire.
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Cohn John M.
Dean Alvar A.
Farrahi Amir H.
Hathaway David J.
Lepsic Thomas M.
Garbowski Leigh M.
Kotulak Richard M.
Schmeiser Olsen & Watts
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