Wiring graphic verification method, program and apparatus

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Reexamination Certificate

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07120881

ABSTRACT:
An edge extraction unit extracts vertical and horizontal wiring edges and slanted wiring edges from overall wiring graphics, and a wiring width classification unit executes a scaling process for the overall wiring graphics to classify the wiring graphics into wiring width ranges which are divided by a predefined reference wiring width. A vertical and horizontal wiring edge extraction unit extracts the vertical and horizontal wiring edges which are in contact with graphics classified into the wiring width ranges, and a vertical and horizontal wiring interval verification unit verifies intervals between the vertical and horizontal wiring edges and opposed edges to be verification counterparts based on a vertical and horizontal reference interval for each wiring width range. A slanted wiring edge extraction unit extracts slanted wiring edges which are in contact with graphics classified into the wiring width ranges, and a slanted wiring interval verification unit verifies intervals between the slanted wiring edges and opposed edges to be verification counterparts based on a slanted reference interval for each wiring width range.

REFERENCES:
patent: 6427225 (2002-07-01), Kitada et al.
patent: 6941531 (2005-09-01), Teig et al.
patent: 2002/0049957 (2002-04-01), Hosono et al.
patent: 2004/0205683 (2004-10-01), Kovacs-Birkas et al.
patent: 2006/0080634 (2006-04-01), Beale
patent: 8-55140 (1993-02-01), None
patent: 11-96200 (1999-04-01), None
patent: 2001-13673 (2001-01-01), None

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