Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-04-12
2005-04-12
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
06880141
ABSTRACT:
An improved method of using the Elmore Model to estimate the delay which is associated with the a clock buffer output. The improved method provides that the clock buffer output resistor is taken into account when the Elmore Model is used to calculate the delay. Also provided is a method of using the Elmore Model to estimate wire delay, where the method includes steps of calculating an approximate delay based on a distributed RC model, and using a capacitance value corresponding to the approximate delay in the Elmore Model to estimate the wire delay.
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patent: 6606587 (2003-08-01), Nassif et al.
Kashyap et al., “An “Effective” Capacitance Based Delay Metric for RC Interconnect”, IEEE, 2000.*
Lukas Van Ginneken, “Buffer Placement in Distributed RC-Tree Networks for Minimal Elmore Delay”, IBM, Thomas J. Watson Research Center, IEEE, 1990, pp. 865-868.*
IBM Technical Disclosure Bulletin, “Buffer Placement in Distributed RC Tree Networks for Minimal Elmore Delay”, vol. 33, No. 8 Jan. 1991, pp. 338-341.
Bowers Brandon
LSI Logic Corporation
Siek Vuthe
Trexler Bushnell Giangiorgi & Blackstone Ltd.
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