Etching a substrate: processes – Etching of semiconductor material to produce an article...
Reexamination Certificate
2007-08-14
2007-08-14
Alanko, Anita (Department: 1765)
Etching a substrate: processes
Etching of semiconductor material to produce an article...
C216S041000, C216S051000, C216S056000, C216S087000, C216S099000
Reexamination Certificate
active
10710984
ABSTRACT:
The present invention illustrates a bulk silicon etching technique that yields straight sidewalls, through wafer structures in very short times using standard silicon wet etching techniques. The method of the present invention employs selective porous silicon formation and dissolution to create high aspect ratio structures with straight sidewalls for through wafer MEMS processing.
REFERENCES:
patent: 5830777 (1998-11-01), Ishida et al.
patent: 6020250 (2000-02-01), Kenney
patent: 6139758 (2000-10-01), Tu
patent: 6358861 (2002-03-01), Ohji et al.
Abdur Abdu Rub
Bhansali Shekhar
Kedia Sunny
Alanko Anita
Sauter Molly L.
Smith & Hopen , P.A.
University of South Florida
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