Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1987-05-11
1988-05-17
Karlsen, Ernest F.
Electricity: measuring and testing
Plural, automatically sequential tests
324 73AT, 371 25, G01R 3128
Patent
active
047453559
ABSTRACT:
A method and apparatus for testing very large scale integrated circuit devices, most particularly Level Sensitive Scan Design (LSSD) devices, by applying differently configured sequences of pseudo-random patterns in parallel to each of the input terminals of the device under test, collecting the output responses from each of the output terminals in parallel, combining these outputs to obtain a signature which is a predetermined function of all of the sequences of parallel outputs and comparing the test signature with a known good signature obtained by computer simulation. The input test stimuli are further altered in a predetermined fashion as a function of the structure of the device to be tested, to individually weight the inputs in favor of more or less binary ones or zeros.
REFERENCES:
patent: 4503537 (1985-03-01), McAnney
patent: 4594711 (1986-06-01), Thatte
Eichelberger Edward B.
Langmaid Roger N.
Lindbloom Eric
Motika Franco
Sinchak John L.
Crane John D.
International Business Machines - Corporation
Karlsen Ernest F.
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