Weighted random pattern testing apparatus and method

Electricity: measuring and testing – Plural – automatically sequential tests

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324 73AT, 371 25, G01R 3128

Patent

active

047453559

ABSTRACT:
A method and apparatus for testing very large scale integrated circuit devices, most particularly Level Sensitive Scan Design (LSSD) devices, by applying differently configured sequences of pseudo-random patterns in parallel to each of the input terminals of the device under test, collecting the output responses from each of the output terminals in parallel, combining these outputs to obtain a signature which is a predetermined function of all of the sequences of parallel outputs and comparing the test signature with a known good signature obtained by computer simulation. The input test stimuli are further altered in a predetermined fashion as a function of the structure of the device to be tested, to individually weight the inputs in favor of more or less binary ones or zeros.

REFERENCES:
patent: 4503537 (1985-03-01), McAnney
patent: 4594711 (1986-06-01), Thatte

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Weighted random pattern testing apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Weighted random pattern testing apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Weighted random pattern testing apparatus and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1883443

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.