Wander generator having arbitrary TDEV mask characteristic...

Electrical computers and digital processing systems: support – Clock – pulse – or timing signal generation or analysis

Reexamination Certificate

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Details

C345S440000, C702S124000

Reexamination Certificate

active

06854068

ABSTRACT:
In a file, the TDEV mask data information including the TDEV mask data constituted by connecting a plurality of line segments and a calculation expression for forming the TDEV mask data, are stored in advance. A readout section reads out a predetermined TDEV mask data information from the file. A display section displays the line segment which is represented by the desired TDEV mask data information. An operating section inputs information for changing at least one of the start point and the characteristic value to the desired value with respect to the line segment to be represented by the desired TDEV mask data information. A TDEV mask data change section receives information inputted by the operating section and changes TDEV mask data ifnromation based on the calculation expression of the TDEV mask data information, and allows the display section to display the line segment represented by the changed TDEV mask data information.

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Sonet User Guide, OmniBER 719, Agilent Technologies, Pinted Sep. 2000.*
Agilent Technologies OmniBER OTN Jitter Analyzer J7231B Technical Data Sheet, copyright 2002.*
Agilent Technologies “Characterize your network synchronization status as it develops”, E4547A wander analysis software, Jun. 30, 2004.*
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