Waferscale package system

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Entirely of metal except for feedthrough

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S704000

Reexamination Certificate

active

07414310

ABSTRACT:
A waferscale package system is provided forming a protection structure comprises forming a wafer, fabricating a device element on the wafer, forming a waferscale spacer around the device element, and attaching a waferscale cap to the waferscale spacer to cover the device element, attaching a carrier to the protection structure, and molding an encapsulant around the protection structure to the carrier.

REFERENCES:
patent: 6452238 (2002-09-01), Orcutt et al.
patent: 6828674 (2004-12-01), Karpman
patent: 6890786 (2005-05-01), Walker et al.
patent: 6911727 (2005-06-01), Martin et al.
patent: 6953985 (2005-10-01), Lin et al.
patent: 6954275 (2005-10-01), Choi et al.
patent: 6960971 (2005-11-01), Park et al.
patent: 7202552 (2007-04-01), Zhe et al.
patent: 2002/0180032 (2002-12-01), Sun et al.
patent: 2003/0036502 (2003-02-01), Gassner et al.
patent: 2004/0016995 (2004-01-01), Kuo et al.
patent: 2005/0202591 (2005-09-01), Chen et al.
patent: 2005/0233492 (2005-10-01), Ouellet et al.
patent: 2006/0071324 (2006-04-01), Lu et al.
patent: 2006/0105503 (2006-05-01), Ding et al.
patent: 2006/0192281 (2006-08-01), Lu et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Waferscale package system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Waferscale package system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Waferscale package system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4006277

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.