Coating processes – Measuring – testing – or indicating
Patent
1990-01-18
1992-05-12
Bueker, Richard
Coating processes
Measuring, testing, or indicating
4272481, 437 8, 118715, 118729, C23C 1600
Patent
active
051126419
ABSTRACT:
A wafer transfer method and mechanism in a vertical CVD diffusion apparatus and a control device for the method and mechanism. The vertical-type CVD diffusing apparatus has a boat containing many wafers in a horizontal orientation, stacked vertically. Product wafers are transferred to the boat five by five, dummy wafers are transferred five by five or a fraction less than five, and monitor wafers are inserted one by one between a block of the product wafers and another block of the product wafers, or a block of the dummy wafers.
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English translation of Japanese Patent Application No. 62-130524.
Harada Yasuhiro
Izumi Shoichiro
Karino Toshikazu
Saito Ryoji
Tometsuka Koji
Bueker Richard
Kokusai Electric Co. Ltd.
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