Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step
Patent
1990-10-31
1992-03-10
Breneman, R. Bruce
Adhesive bonding and miscellaneous chemical manufacture
Delaminating processes adapted for specified product
Delaminating in preparation for post processing recycling step
156603, 156DIG64, 428428, 4284111, C30B 108
Patent
active
050947141
ABSTRACT:
A wafer structure for forming a semiconductor single crystal film comprises a semiconductor single crystal substrate, a plurality of recesses formed in a grooved shape to one main surface of the semiconductor single crystal substrate, insulation material embedded to the inside of these recesses, an insulation layer deposited over the insulation material and the semiconductor single crystal substrate and integrated with the insulation material and a polycrystalline or amorphous semiconductor layer to be recrystallized disposed over the insulation layer.
A wafer structure with no or less grain boundaries can be obtained. Further, polycrystalline or amorphous semiconductor layer can be prevented from peeling off the substrate by the additional layering of a protecting insulation layer.
REFERENCES:
patent: 3969168 (1976-07-01), Kuhn
patent: 4178396 (1979-12-01), Okano et al.
patent: 4371421 (1983-02-01), Fan et al.
patent: 4444620 (1984-04-01), Kovacs et al.
patent: 4544576 (1985-10-01), Chu et al.
patent: 4565584 (1986-01-01), Tamura et al.
patent: 4565599 (1986-01-01), Geis et al.
patent: 4585512 (1986-04-01), Hayafuji et al.
patent: 4678538 (1987-07-01), Haond et al.
patent: 4773964 (1988-09-01), Haond
Kawamura et al., "Laser Recrystallization of Si over SiO.sub.2 with a Heat-Sink Structure", J. Appl. Phys. 55(6) 1984, pp. 1607-1609.
Bean et al., "Dielectric Isolation: Comprehensive, Current, and Future", J. Electrochem. Soc., vol. 124, No. 1, pp. 5C-12C.
Geis et al., Journal of Electrochem. Soc., vol. 130, No. 5, pp. 1178-1183.
Inoue Yasuo
Kusunoki Shigeru
Nishimura Tadashi
Sugahara Kazuyuki
Breneman R. Bruce
Mitsubishi Denki & Kabushiki Kaisha
LandOfFree
Wafer structure for forming a semiconductor single crystal film does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Wafer structure for forming a semiconductor single crystal film, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wafer structure for forming a semiconductor single crystal film will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2282648