Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Die bond
Reexamination Certificate
2006-05-02
2006-05-02
Nelms, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Die bond
C257S621000, C438S109000
Reexamination Certificate
active
07038324
ABSTRACT:
Wafer stacking employing substantially uniform copper structures is described herein.
REFERENCES:
patent: 6106735 (2000-08-01), Kurle et al.
patent: 6558109 (2003-05-01), Gibbel
patent: 6627985 (2003-09-01), Huppenthal et al.
patent: 2004/0262772 (2004-12-01), Ramanathan et al.
patent: 2005/0003650 (2005-01-01), Ramanathan et al.
RamachandraRao Vijayakumar S.
Ramanathan Shriram
Intel Corporation
Lee Calvin
Nelms David
Schwabe Williamson & Wyatt P.C.
LandOfFree
Wafer stacking using interconnect structures of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Wafer stacking using interconnect structures of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wafer stacking using interconnect structures of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3590503